GKS Spring-Loaded Test Probe

 

Series
Grid
in Mil
Grid
in mm
Max. Stroke
in mm
Working Stroke
in mm
Current Rating
in (A)
PDF
STEP 3-D Files (ZIP)
E-TYPE Test Probes For Lead-Free Contacting
E-050 50 1,27 5 4,3 3 E-050 E-050
E-075 75 1,91 5 4,3 4 E-075 E-075
E-100 100 2,54 5 4,3 5 E-100 E-100
E-422 422 2,54 8 6,4 5 E-422
E-TYPE HIGH-ENERGY PROBE

 

In-Circuit / Functional Test (ICT / FCT)
GKS-040 40 1 6,35 4,3 2 GKS-040
GSK-050 50 1,27 6,35 4,3 3 GKS-050 GKS-050
GKS-015 50 1,27 10 8 3 GKS-015
GKS-075
75
1,91
4,3
6,35
3 – 4
GKS-075
75
1,91
4,3
6,35
3 – 4
GKS-100
100
2,54
4,3
6,35
5 – 8
GKS-100
100
2,54
4,3
6,35
5 – 8
GKS-035
75 1,91 10 8 3 – 4 GKS-035 GKS-035
GKS-135 100 2,54 11,5 9,3 5 – 8 GKS-135 GKS-135
GKS-101 75 1,91 5,3 4 3 – 4 GKS-101
GKS-001 75 1,91 2,4 2 3 – 4 GKS-001
GKS-002 100 2,54 4,1 2,7 5 – 8 GKS-002 GKS-002
GKS-003 125 3,18 6,35 4,4 6 GKS-003 GKS-003
GKS-004 187 4,75 6,35

4,4

7 GKS-004 GKS-004
GKS-005 187 4,75 6,35 4,4 8 GKS-005 GKS-005
KS-040 WL 40 1 2 KS-040 WL
KS-550 WL 50 1,27 3 KS-550 WL
KS-075 WL 75 1,91 4 KS-075 WL
KS-100 WL 100 2,54 5 KS-100 WL
Bead Probes
GKS-050 50 1,27 6,35 4,3 3 GKS-050 GKS-050
GKS-075 75 1,91 6,35 4,3 3 – 4 GKS-075 GKS-075
GKS-100 100 2,54 6,35 4,3 5 – 8 GKS-100 GKS-100
GKS-135 135 2,54 11,35 9,3 5 – 8 GKS-135
BEAD PROBE CONTACTING

 

Fine Pitch Test Probes 25 MIL or Less
GKS-038 25 0,64 2,5 2 1 GKS-038 GKS-038
GKS-041 28 0,7 3,5 2,5 2 GKS-041 GKS-041
GLS-061 30 0,8 3,5 2,5 2 GKS-061 GKS-061
GKS-080 40 1 3 3 3,8 GKS-080 GKS-080
GKS-081 40 1 7,5 5,5 3 GKS-081 GKS-081
GKS-069 50 1,27 2,8 2,2 3 GKS-069 GKS-069
GKS-079 50 1,27 1,2 1 3 GKS-079 GKS-079
GKS-181 50 1,27 7,5 5,5 3 GKS-181 GKS-181
Test Probes 40 MIL
GKS-040 40 1 6,35 4,3 2 GKS-040
GKS-080 40 1 3,8 3 3 GKS-080 GKS-080
GKS-081 40 1 7,5 5,5 3 GKS-081 GKS-081
Interface Test Probes
GKS-945 100 2,54 3,1 2,6 5 GKS-945 GKS-945
GKS-946 100 2,54 3,9 3,2 5 GKS-946 GKS-946
GKS-938 100 2,54 4,3 3,6 5 GKS-938 GKS-938
GKS-100 Series forTeradyne 100 2,54 6,35 4,3 5 GKS-100 307 GKS-100 307
GKS-100 Series forAgilent / HP 3070 200 5,08 6,35 4,3 5 GKS-100 306 GKS-100 306
GKG-100 Series forFactron 300/700 100 2,54 4 3 5 GKS100-357 GKS-100 357
GKS 925 TJA 200 5 6 5 5 GKS-925 TJA
GKS-416 180 4,5 11,5 9,2 GKS-416 GKS-416
GKS-102 200 5 6,5 4,8 GKS-102 GKS-102
GKS-504 180 4,5 14 11,2 5 – 15 GKS-504 GKS-504
GKS-414 315 8 11,2 9,6 5 – 8 GKS-414 GKS-414
Battery Test Probes
GKS-967 120 3 1,2 1 5 -8 GKS-967 GKS-967
GKS-970 120 3 3,3 2,8 5 – 8 GKS- 970 GKS-970
GKS-961 75 1,91 1,3 1 2 GKS-961 GKS-961
Special Test Probes
GKS-004 187 4,75 6,35 4,4 7 GKS-004 GKS-004
GKS-005 187 4,75 6,35 4,4 8 GKS-005 GKS-005
GKS-113 157 4 5,3 4 5 – 8 GKS-113 GKS-113
GKS 913 157 4 3,5 2,8 5 – 8 GKS-913 GKS-913
GKS 913 M 160 4 3,5 2,8 5 – 8 GKS-913 M
GKS-103/103 M 157 4 6 4,8 5 – 8 GKS-103/103 M GKS-103/103 M
GKS-503/503 M 157 4 7 5,6 5 – 15 GKS-503/503 M GKS-503/503 M
GKS-364 260 6,5 5 4 15 GKS-364
GKS-365 250 6,5 4 3,2 8 GKS-365
GKS-366 366 6,5 10 8 5 – 8 GKS-366
GKS-725 100 2,54 6 4,8 5 – 8 GKS-725 GKS-725
GKS-713 180 4,5 5 4 5 – 8 GKS-713 GKS-713
Metric Standard Test Probes (2,54 or greater)
KS-112 100 2,54 16 KS-112 KS-112
GKS-112 100 2,54 5,3 / 8 4 / 6,4 5 – 8 GKS-112 GKS-112
GKS-912 100 2,54 5 4 5 – 8 GKS-912 GKS-912
GKS-422 100 2,54 8 6,4 5 – 8 GKS-422 GKS-422
GKS-412 100 2,54 9,8 8 5 – 8 GKS-412 GKS-412
GKS-204 /204 M 100 2,54 10 8 5 – 8 GKS-204/204 M GKS-204/204 M
GKS-102 100 2,54 6,5 4,8 5 – 8 GKS-102 GKS-102
GKS-502 100 2,54 7 5,6 5 – 15 GKS-502 GKS-502
GKS-113 157 4 5,3 4 5 – 8 GKS-113 GKS-113
GKS-913 157 4 3,5 2,8 5 – 8 GKS-913 GKS-913
GKS-103/103 M 157 4 6 4,8 5 – 8 GKS-103/103 M GKS-103/103 M
GKS-503/503 M 157 4 7 5,6 5 – 15 GKS-503/503 M GKS-503/503 M
GKS-364 260 6,5 5 4 15 GKS-364
GKS-365 260 6,5 4 3,2 8 GKS-365
GKS-366 366 6,5 10 8 5 – 8 GKS-366
Solderable Test Probes GKS
GKS-941 75 1,91 4 3,2 5 – 8 GKS-941 GKS-941
GKS-064 100 2,54 1,7 1,4 5 – 8 GKS-064 GKS-064
GKS-986 100 2,54 5 3 5 – 8 GKS-986 GKS-986

 

 

 

 

 

Design of  Test Probes

 

 

Spring-loaded Test Probes (GKS) normally consist of 3 individual components. All components must be manufactured with the type of precision, which is demanded by the micro-electronics industry.

The Plunger with the contacting zone is available in a large choice of tip-styles. It must provide the smallest possible contact resistance between the Test Probe and test point, to ensure that measurement results are not distorted. The most common plunger materials are Steel and CuBe – both of which are hardened. For very passive tip-styles brass is also used.

The Spring provides the necessary contact pressure and this even after several hundred thousand strokes (testing cycles). The specified spring-forces are reached with the recommended working stroke and are subject to a tolerance range of +/- 10-15%; this being due to the parameter restrictions when designing and manufacturing springs for such small components.

For easy measurement of the spring forces, common spring-force measuring gauges are used.

The Barrel accommodates the plunger and the spring. The actual measurement signal flows via the barrel to the Receptacle. To improve the smooth movement, after gold-plating the barrel is treated with a very thin organic protective layer.