TR 5001
Introduction
TR5001 includes a mix of MDA, ICT and functional testing within one platform, allowing a complete optional
testing model which provides an economical testing solution according to the needs of customers.
TR5001 incorporates ICT & Functional test that cut production line staff costs, save testing time lengths and
increase productivity.
Features
- High-Fault Coverage Test Solution
- Supports Cost Down Solution with Optional Analog and Hybrid Boards
- Most Competitive Rapid Test Speed
- Supports Digital 1:1 Driver/Receiver per Pin Architecture Design
- Powerful Boundary Scan Test (1149.6) Solutions
- Modularized Test System
- Open Source Code Structure
Cost-Effective, Modularized Press-Type Test System
The press type system is more economical than vaccum type board testers, with fixture costs reduced
by over 50%. Customers can start with a basic manufacturing defects analyzer (MDA) and easily add
functions such as in-circuit test, functional test, on-board programming,
and IEEE 1149 boundary scan when needed.

Full-Featured Analog MDA Can Upgrade to Digital In-Circuit Tester
The TR5001′s modular design allows for all analog or mixed (hybrid) analog/digital testing.
With a maximum 3,200 analog test points, the TR5001 uses a digital signal and filter to
improve analog test performance and speed – much better than traditional MDA’s.
When upgraded to a digital in-circuit tester, the TR5000 offers a maximum of 1,600
analog/digital test points, low-voltage device test capability, high pin-count BGA testing,
and enhanced On-board Flash programming (OBP) capability.
Supports Digital 1:1 Driver/Receiver per Pin Architecture Design
TRI’s efficient design means all pins are drive/receive: there is no multiplexing, no wasted
pins. This lowers system cost for large pin-count devices and allows for fast test program
development, as no vector model is required before fixture development. Engineering
changes to fixture are simpler and cheaper to perform.
Convenient On-Board Programming Solution Saves Time, Money
On-Board programming components, such as Flasch memory and other PLDs
(Programmable Logic Devices) can provide board designers and manufacturers
great flexibility and cost savings. TRI helps reduce component inventory and handling
costs by allowing these devices to be programmed during the test phase instead of
being programmed off-line and then assembled onto the PCBA. The TR5001′s OBP
function allows changes to the programmed data, making ECOs easier and cheaper
to implement.
No Access Test Solutions
TRI board testers are already prepared for the reduce test access found on more and
more PCBAs. In additional to offering Boundary Scan testing, TRI has developed other
no-test access solutions, notably ToggleScan (based on the draft IEEE 1149.8.1 specification)
a socket sensor test and other innovative test methods.

HDI designs feature microvias, which allow for a greater number of components, but eliminate
the traditional test pad: there is no place to put a standard test probe ToggleScan solves this
problem by sensing the test signal through the target device.

Vreg Test
The TRI VregTest™ is an innovative new technology designed to detected defects in power
switching circuits. The VregTest™ goes further than traditional test methods by expanding
test coverage, allowing test probes to be placed an Vreg components such as MOSFET drivers,
MOSFETs coils, and some PCB traces. This limited access method significantly reduces
on-board test points and fixture probes. An ideal application for component-dense
motherboards, TRI has developed the VregTest™ to fulfill the need for better test coverage
that results in the reduction of field failures. TRI dells and services the VregTest™ and
provides customers with installation assistance as well as operational and technical materials.
The TRI VergTest™ improves test coverage compared to traditional test mathods and assists
in computer programming, computer system design, industrial design and computer
hardware consulting projects.
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